A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

Solid state detectors for electron current measurements are a well-established tool in electron microscopy, especially for the detection of backscattered electrons (BSE) underneath the pole piece inside a SEM or for the measurement of transmitted electrons in STEM or TEM applications. The progress in electron microscopy over the last years has led to many interesting new applications but also t...

A Fast, Robust, Automatic Blink Detector

Introduction “Blink” is defined as closing and opening of the eyes in a small duration of time. In this study, we aimed to introduce a fast, robust, vision-based approach for blink detection. Materials and Methods This approach consists of two steps. In the first step, the subject’s face is localized every second and with the first blink, the system detects the eye’s location and creates an ope...

Use of a silicon drift detector for cathodoluminescence detection

Silicon Drift Detector Readout and On-Line Data Reduction using a Fast VLSI Dedicated Fuzzy Processor

A Silicon Drift Detector Front-End and a Smart Readout System different from a trivial zerosuppression is proposed. ON-LINE pre-processing, using a Fast VLSI dedicated Fuzzy Processor, reduces significantly acquisition data volume and hardware requirements. Silicon Drift Detectors Readout and ON-LINE Data Reduction using a Fast VLSI Dedicated Fuzzy Processor 2

Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector.

Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced ...